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Standard Test Probe B With 50N Force For IEC61032 Figure 2 And IEC 60529 IP2X

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Standard Test Probe B With 50N Force For IEC61032 Figure 2 And IEC 60529 IP2X

Name: Standard Test Probe B With 50N Force For IEC61032 Figure 2 And IEC 60529 IP2X
Brand: Sinuo
Price: 1 USD

Wholesale Standard Test Probe B With 50N Force For IEC61032 Figure 2 And IEC 60529 IP2X from china suppliers

Brand Name : Sinuo

Model Number : SN2210-2T

Certification : Calibration Certificate(Cost Additional )

Place of Origin : China

MOQ : 1

Price : Customized

Payment Terms : T/T

Supply Ability : 100 sets per month

Delivery Time : 3 Days

Packaging Details : Carton Box

Test Standard : IEC 61032 and IEC 60529 IP2X

Applied Figure : Figure 2

Handle Material : Nylon

Probe Material : Stainless Steel

Force : 0-50N

Accessory : M6 Thread And Banana Clip

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Standard Test Probe B With 50N Force For IEC61032 Figure 2 And IEC 60529 IP2X

Product information:

This test probe complies with the requirements of Probe B as specified in IEC 61032 and IEC 60529 IP2X. It features an M6 threaded hole at the end of the handle, allowing it to be connected to a force gauge for precise testing applications.

Technical parameters:

Parameters /Model	SN2210-2T
Name	Standard test probe with force
Joint 1	30±0.2 (mm)
Joint 2	60±0.2 (mm)
Finger length	80±0.2 (mm)
Fingertip to baffle	180±0.2 (mm)
Cylindrical	R2±0.05 (mm)
Spherical	S4±0.05 (mm)
Fingertip cutting bevel angle	37^o ⁰ _-10’
Fingertip taper	14^o ⁰ _-10’
Test finger diameter	Ф12 ⁰_-0.05(mm)
A-A Section diameter	Ф50(mm)
A-A Section width	20±0.2
Baffle diameter	Ф75±0.2(mm)
Baffle thickness	5±0.5(mm)
Built-in Force	0-50N force, resolution of 5N

Standard Test Probe B With 50N Force For IEC61032 Figure 2 And IEC 60529 IP2X

Product Tags:

IEC61032 Test Probe

60529 IP2X Test Probe

IEC 60529 Test Probe

Standard Test Probe B With 50N Force For IEC61032 Figure 2 And IEC 60529 IP2X Images

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